Unlike the electron beam used in scanning and transmission electron microscopy (SEM, TEM), the beam in a focused ion beam ... beam are derived from a liquid metal ion source (LMIS). In the Hitachi ...

The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope. This SEM permits ultra high resolution imaging of thin films and semi-conductor materials on ...

[Macona] is part of the latter group, with a Hitachi S-450 SEM he’s repaired and modified himself. [Macona] has documented the whole thing on Hackaday.io. The Hitachi came to him and a friend as ...