AZOM6y
C-Swift CMOS Detector for Materials Analysis and High-Throughput Sample Characterization
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AZoNano4y
C-Nano: An EBSD Detector for High-Performance Entry into CMOS Technology
Utilizing a tailored CMOS sensor, C-Nano provides a top acquisition speed of 400 pps with outstanding 312 x 256 pixel resolution patterns: this renders it about three times faster than comparable ...
Bruker Launches X4 POSEIDON™ Advanced X-Ray Microscope for Three-Dimensional Microscopy in Industrial and Scientific Applications
Bruker Corporation (Nasdaq: BRKR) today announces the launch of the new X4 POSEIDON™, a high-performance 3D X-ray microscope (XRM) using micro-Computed Tomography (microCT). This innovative benchtop ...
Design-Reuse6mon
Process Detector (For DVFS and monitoring process variation), TSMC N3EP
An embedded process detector circuit which helps Integrated Circuit (IC) developers to address the problem of process variability on low-geometry CMOS designs. The process detector provides the means ...
AZOM4y
EDAX Clarity EBSD Detector Series
The incident electrons create multiple electron-hole pairs inside the silicon during impact, and a bias voltage transfers the charge toward the underlying CMOS detector, where it counts each event.