CINTRA UMI CNRS/NTU/THALES 3288, Research Techno Plaza, 50 Nanyang Drive, Border X Block, Level 6, Singapore 637553, Singapore School of Electrical and Electronic Engineering, Nanyang Technological ...

This paper investigates the Single-Event Burnout (SEB) effect in thin irradiated PiN diodes and Low-Gain Avalanche Diodes, LGAD. SEB is a destructive event triggered in silicon sensors by the passage ...

Abstract: This letter describes the manufacture and performance of a monolithic double-layer silicon photonic crystal temperature sensor ... and mounted on the facet of a standard single-mode optical ...

Quantification of polymorphs by Rietveld analysis (38) was performed using TOPAS-V 5.0. 2.5. In-Situ Variable Temperature Single-Crystal X-ray Diffraction Variable temperature Raman measurements was ...