CINTRA UMI CNRS/NTU/THALES 3288, Research Techno Plaza, 50 Nanyang Drive, Border X Block, Level 6, Singapore 637553, Singapore School of Electrical and Electronic Engineering, Nanyang Technological ...

This paper investigates the Single-Event Burnout (SEB) effect in thin irradiated PiN diodes and Low-Gain Avalanche Diodes, LGAD. SEB is a destructive event triggered in silicon sensors by the passage ...

Scientists uncovered rare hexagonal silicon forms (2H, 4H, 6H) created by stress and heat, challenging assumptions about this key electronic material.

Abstract: This letter describes the manufacture and performance of a monolithic double-layer silicon photonic crystal temperature sensor ... and mounted on the facet of a standard single-mode optical ...

Quantification of polymorphs by Rietveld analysis (38) was performed using TOPAS-V 5.0. 2.5. In-Situ Variable Temperature Single-Crystal X-ray Diffraction Variable temperature Raman measurements was ...

Abstract: The paper is concerned with an investigation of the effect of the mist-deposited downshifting nanocrystalline quantum dots (NQD) films both continuous and patterned on the performance of ...